ASTM D5796-2003(2010) 用钻孔装置破坏性测量薄膜盘绕覆层系统的干膜厚度的标准试验方法
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【英文标准名称】:StandardTestMethodforMeasurementofDryFilmThicknessofThinFilmCoil-CoatedSystemsbyDestructiveMeansUsingaBoringDevice
【原文标准名称】:用钻孔装置破坏性测量薄膜盘绕覆层系统的干膜厚度的标准试验方法
【标准号】:ASTMD5796-2003(2010)
【标准状态】:现行
【国别】:美国
【发布日期】:2003
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:D01.53
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:
【英文主题词】:borerbit;boring;crater;destructive;dryfilm;measurestage;micrometer;opticalmeasurement;thickness;thinfilms;videocamera;Boringdevices;Coatings(paint/relatedapplications);Coatingthickness;Destructivetesting--coatings;Dryfilmthickn
【摘要】:Measurementofdryfilmthicknessoforganiccoatingsbyphysicallycuttingthroughthefilmandopticallyobservingandmeasuringthethicknessofferstheadvantageofdirectmeasurementascomparedwithnondestructivemeans.Constituentcoatinglayersofanoverallthicknessofacoatingsystemcanusuallybemeasuredindividuallybythistestmethod,provideadhesionbetweeneachlayerissufficient.(However,thiscanbedifficultincaseswheretheprimer,topcoat,ormultiplecoatinglayershavethesame,orverysimilar,appearance.)1.1Thistestmethodcoversthemeasurementofdryfilmthickness(DFT)ofcoatingfilmsbymicroscopicobservationofaprecision-cut,shallow-anglecraterboredintothecoatingfilm.Thiscraterrevealscrosssectionallayersappearingasrings,whosewidthisproportionaltothedepthofthecoatinglayer(s)andallowsfordirectcalculationofdryfilmthickness.1.1.1TheApparatus,Procedure,andPrecisionandBiasdiscussionsincludeMethodAandMethodB.MethodAinvolvestheuseofanopticalmeasurementapparatuswhichisnolongercommerciallyavailable,butremainsavalidmethodofdryfilmmeasurement.MethodBisasoftwaredrivenmeasurementprocedurethatsupersedesMethodA.1.2Thesubstratemaybeanyrigid,metallicmaterial,suchascold-rolledsteel,hot-dippedgalvanizedsteel,aluminum,etc.Thesubstratemustbeplanarwiththeexceptionofsubstratesexhibitingx201C;coilset,x201D;whichmaybeheldlevelbytheuseoftheclampingtoolonthedrillingdevice.Note18212;Variationsinthesurfaceprofileofthesubstratemayresultinmisrepresentativeorganiccoatingthicknessreadings.Thisconditionmayexistoversubstratessuchashot-dipped,coatedsteelsheet.Thisistrueofallx201C;precisioncutx201D;methodsthatareusedtodeterminedryfilmthicknessoforganiccoatings.Thisiswhyseveralmeasurementsacrossthestripmaybeusefulifsubstratesurfaceprofileissuspect.1.3Therangeofthicknessmeasurementis0to3.5mils(0to89x03BC;m).Note28212;ForDFTmeasurementsoffilmsgreaterthan3.5mils(89x03BC;m),butlessthan63mils(1600x03BC;m),a45x00B0;borermaybeusedinaccordancewiththistestmethod,withtheexceptionof6.8,wherethemicrometerreadingwouldprovideadirectread-out,anddivisionbytenwouldbeunnecessaryper4.3.1MethodA.1.4Measurementsmaybemadeoncoil-coatedsheet,certainformedproducts,orontestpanels.1.5ThevaluesstatedinSIunitsaretoberegardedasthestandard.Thevaluesgiveninparenthesesareforinformationonly.1.6Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.
【中国标准分类号】:A29
【国际标准分类号】:17_040_20
【页数】:4P.;A4
【正文语种】:英语
【原文标准名称】:用钻孔装置破坏性测量薄膜盘绕覆层系统的干膜厚度的标准试验方法
【标准号】:ASTMD5796-2003(2010)
【标准状态】:现行
【国别】:美国
【发布日期】:2003
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:D01.53
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:
【英文主题词】:borerbit;boring;crater;destructive;dryfilm;measurestage;micrometer;opticalmeasurement;thickness;thinfilms;videocamera;Boringdevices;Coatings(paint/relatedapplications);Coatingthickness;Destructivetesting--coatings;Dryfilmthickn
【摘要】:Measurementofdryfilmthicknessoforganiccoatingsbyphysicallycuttingthroughthefilmandopticallyobservingandmeasuringthethicknessofferstheadvantageofdirectmeasurementascomparedwithnondestructivemeans.Constituentcoatinglayersofanoverallthicknessofacoatingsystemcanusuallybemeasuredindividuallybythistestmethod,provideadhesionbetweeneachlayerissufficient.(However,thiscanbedifficultincaseswheretheprimer,topcoat,ormultiplecoatinglayershavethesame,orverysimilar,appearance.)1.1Thistestmethodcoversthemeasurementofdryfilmthickness(DFT)ofcoatingfilmsbymicroscopicobservationofaprecision-cut,shallow-anglecraterboredintothecoatingfilm.Thiscraterrevealscrosssectionallayersappearingasrings,whosewidthisproportionaltothedepthofthecoatinglayer(s)andallowsfordirectcalculationofdryfilmthickness.1.1.1TheApparatus,Procedure,andPrecisionandBiasdiscussionsincludeMethodAandMethodB.MethodAinvolvestheuseofanopticalmeasurementapparatuswhichisnolongercommerciallyavailable,butremainsavalidmethodofdryfilmmeasurement.MethodBisasoftwaredrivenmeasurementprocedurethatsupersedesMethodA.1.2Thesubstratemaybeanyrigid,metallicmaterial,suchascold-rolledsteel,hot-dippedgalvanizedsteel,aluminum,etc.Thesubstratemustbeplanarwiththeexceptionofsubstratesexhibitingx201C;coilset,x201D;whichmaybeheldlevelbytheuseoftheclampingtoolonthedrillingdevice.Note18212;Variationsinthesurfaceprofileofthesubstratemayresultinmisrepresentativeorganiccoatingthicknessreadings.Thisconditionmayexistoversubstratessuchashot-dipped,coatedsteelsheet.Thisistrueofallx201C;precisioncutx201D;methodsthatareusedtodeterminedryfilmthicknessoforganiccoatings.Thisiswhyseveralmeasurementsacrossthestripmaybeusefulifsubstratesurfaceprofileissuspect.1.3Therangeofthicknessmeasurementis0to3.5mils(0to89x03BC;m).Note28212;ForDFTmeasurementsoffilmsgreaterthan3.5mils(89x03BC;m),butlessthan63mils(1600x03BC;m),a45x00B0;borermaybeusedinaccordancewiththistestmethod,withtheexceptionof6.8,wherethemicrometerreadingwouldprovideadirectread-out,anddivisionbytenwouldbeunnecessaryper4.3.1MethodA.1.4Measurementsmaybemadeoncoil-coatedsheet,certainformedproducts,orontestpanels.1.5ThevaluesstatedinSIunitsaretoberegardedasthestandard.Thevaluesgiveninparenthesesareforinformationonly.1.6Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.
【中国标准分类号】:A29
【国际标准分类号】:17_040_20
【页数】:4P.;A4
【正文语种】:英语
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